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Modeling of SET Seasoning Effects in Phase Change Memory Arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
MICROELECTRONICS RELIABILITY
Vol. 52, No. 6, pp: 1060-1064, Anno: 2012 |
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Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 59, No. 3, pp: 813-818, Anno: 2012 |
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Reliability and performance characterization of a mems-based non-volatile switch
R., Gaddi; C., Schepens; Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
Reliability Physics Symposium (IRPS), 2011 IEEE International,
Reliability Physics Symposium (IRPS), 2011 IEEE International
pp: 2G.2.1-2G.2.6, Anno: 2011 |
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Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
Reliability Physics Symposium (IRPS), 2011 IEEE International,
Reliability Physics Symposium (IRPS), 2011 IEEE International
pp: MY.4.1-MY.4.5, Anno: 2011 |
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A Statistical Model of Erratic Behaviors in Flash Memory Arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 58, No. 11, pp: 3707-3711, Anno: 2011 |
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Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
SOLID-STATE ELECTRONICS
Vol. 58, No. 1, pp: 23-27, Anno: 2011 |
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Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off
Zambelli, Cristian; Bertozzi, Davide; Chimenton, Andrea; Olivo, Piero
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE EMBEDDED SYSTEMS LETTERS
Vol. 3, No. 1, pp: 13-15, Anno: 2011 |
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Reliability of NAND Flash Memories
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Contributo in volume |
Springer,
Inside NAND Flash Memories
pp: 89-114, Anno: 2010 |
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A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE ELECTRON DEVICE LETTERS
Vol. 31, No. 6, pp: 612-614, Anno: 2010 |
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A New Analytical Model of the Erasing Operation in Phase Change Memories
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE ELECTRON DEVICE LETTERS
Vol. 31, No. 3, pp: 198-200, Anno: 2010 |
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Experimental characterization of SET Seasoning on Phase Change Memory arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electornic Engineers (IEEE),
2010 IEEE International Memory Workshop
pp: 29-32, Anno: 2010 |
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Electrical Characterization and Modeling
of Phase Change Memory arrays
Chimenton, Andrea
dettagli >>
Atto di Convegno (Proceedings) |
ELECTRON DEVICES SOCIETY, IEEE,
Proceedings 2009 Non-Volatile Memory Technology Symposium
pp: 1-6, Anno: 2009 |
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A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
2009 IEEE Proceedings of the International Reliability Physics Symposium, 47th Annual
Vol. 47, No. 1, pp: 128-133, Anno: 2009 |
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A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers, Inc,
2009 IEEE International Reliability Physics Symposium, 47th Annual
Vol. 47, No. 1, pp: 896-901, Anno: 2009 |
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Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
ELECTRON DEVICE SOCIETY, IEEE,
ESSDERC/ESSCIRC Conference Proceedings
pp: 213-216, Anno: 2009 |
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Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero; F. P., Leisenberger; A., Wiesner; G., Schatzberger; E., Wachmann; M., Schrems
dettagli >>
Atto di Convegno (Proceedings) |
ELECTRON DEVICE SOCIETY, IEEE,
Proceedings 2009 Non-Volatile Memory Technology Symposium
pp: 63-66, Anno: 2009 |
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Reliability of Floating Gate Memories
Chimenton, Andrea; M., Atti; Olivo, Piero
dettagli >>
Contributo in volume |
Springer,
Error Correction Codes for non-volatile memories
pp: 221-247, Anno: 2008 |
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Reliability in Wireless Systems
Chimenton, Andrea; Olivo, Piero
dettagli >>
Contributo in volume |
Springer,
Memories in Wireless Systems
pp: 221-248, Anno: 2008 |
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Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; A., Pirovano; Olivo, Piero
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint
pp: 49-51, Anno: 2008 |
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Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
Atto di Convegno (Proceedings) |
IEEE,
Non-Volatile Memory Technology Symposium, 2008. NVMTS 2008. 9th Annual
pp: 7-11, Anno: 2008 |
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